Group Defect Characterisation and Infrared Spectroscopy : Facilities

Fourier transform infrared (FT-IR) spectroscopy

Main instrument: BRUKER IFS 66v FT-IR (vacuum model), with spectral range between 10000 and 50 cm-1 (near- to far-IR).

Peripheral equipment:

• Liquid helium cryostats; continuous flow; contact gas and cold finger;

BRUKER IRscope II infrared microscope (transmission, reflection, ATR objective)

Measurement modes:

• Transmission
• Reflection
• Attenuated total reflection (ATR)
• Photothermal ionisation spectroscopy (PTIS)
• Microscope

Deep level transient spectroscopy (DLTS)

Home built double lock-in instrument. Temperature range 5 to 400K (liquid helium and liquid nitrogen continuous flow cryostats). Electrical or optical filling pulse (laser diodes at 900 and 1500 nm wavelength).

Measurement modes:

• DLTS: classical capacitance DLTS using electrical pulse
• ODLTS: capacitance DLTS using optical pulse
• OCDLTS: current DLTS using optical pulse
• Sample preparation

Thermal annealing: programmable oven (Carbolite MTF)

Evaporation equipment (Schottky barriers, ohmic contacts)

Cutting (low speed diamond saw), cleaning, etching and polishing equipment.

Electrical characterisation

Resistivity, Hall-van der Pauw, C-V, lifetime (photoconductive decay).